speakers @ pico 2013

Wolfgang Baumeister
Max Planck Institute of Biochemistry (GERMANY)
››Electron-cryomicroscopy: from molecules to cells‹‹
Chris Boothroyd
Jülich Research Centre (GERMANY)
››Imaging functional groups in graphene oxide at atomic resolution‹‹
Christian Colliex Université Paris-Sud (FRANCE)
››The multi-signal strategy in a STEM to map the optical response of individual nanoparticles‹‹
Ulrich Dahmen Lawrence Berkeley National Laboratory (US)
››Atomic resolution imaging of mechanisms of interface motion in gold bicrystals‹‹
Rafal Dunin-Borkowski
Jülich Research Centre (GERMANY)
››Finite element simulations of semiconductor dopant potentials for electron holography‹‹
Michael Fiddy University of North Carolina at Charlotte (US)
Legacies of the Gerchberg Saxton Algorithm‹‹
Hamish Fraser Ohio State University (US)
ature of the interfaces between the constituent phases in the high entropy alloy CoCrCuFeNiAl‹‹
Bert Freitag
FEI Company – Eindhoven (THE NETHERLANDS)
Charge density within a unit cell of GaN Imaged with sub Ångström by differential phase contrast microscopy‹‹
Max Haider CEOS GmbH – Heidelberg (GERMANY)
››An improved correction system for ultra-high resolution TEM‹‹
Archie Howie University of Cambridge (UK)
Elastic and inelastic electron scattering in the near field region‹‹
Martin Hÿtch CEMES Toulouse (FRANCE)
››In-situ electron holography for the dynamic study of local fields‹‹
Kazuo Ishizuka HREM Research Inc – Higashimatsuyama (JAPAN)
Quantitative evaluation of temporal partial coherence using 3D Fourier transform of through-focus TEM images
Wolfgang Jäger University of Kiel (GERMANY)
››Transmission electron microscopy for high-efficiency solar cells‹‹
Chunlin Jia Jülich Research Centre (GERMANY)
Quantitative HRTEM of oxides‹‹
Ute Kaiser University of Ulm (GERMANY)
››Properties of two-dimensional materials obtained from experiments in a low-voltage aberration-corrected TEM‹‹
Angus Kirkland University of Oxford (UK)
Quantitative electron microscopy of carbon based materials‹‹
Ondrej Krivanek Nion Company – Kirkland (US)
Advances in instrumentation and software for electron microscopy‹‹
Hannes Lichte University of Dresden (GERMANY)
Electron holography in solids: problems and progress‹‹
Laurie Marks Northwestern University (US)
››Profile imaging revisited: the surface of strontium titanate nanocuboids‹‹
Joachim Mayer RWTH Aachen University (GERMANY)
››Nanoswitches – TEM studies of resistive switching phenomena in chalcogenide materials‹‹
Molly McCartney Arizona State University (US)
Electron holography of nanoscale electrostatic and magnetic fields‹‹
John Rodenburg University of Sheffield (UK)
››Ptychography - Easy with X-rays, hard but promising with electrons‹‹
Harald Rose University of Ulm (GERMANY)
Holographic imaging and optical sectioning in the aberration-corrected STEM‹‹
Frances Ross

IBM TJ Watson Research Centre (US)
››Quantitative transmission electron microscopy in liquids‹‹

Owen Saxton University of Cambridge (UK)
Forty years of complex wave determination‹‹
Robert Sinclair Stanford University (US)
HREM analysis of graphite-encapsulated metallic nanoparticles for possible medical applications, and recent aberration-corrected ETEM research‹‹
David Smith Arizona State University (US)
››Exploring aberration corrected electron microscopy imaging for oxide/semiconductor heterostructures‹‹
John Spence Arizona State University (US)
XFELS vs EELS for time-resolved dynamics‹‹
Andreas Thust Jülich Research Centre (GERMANY)
On the optical stability of high-resolution transmission electron microscopes‹‹
Knut Urban Jülich Research Centre (GERMANY)
FTEM at atomic resolution in the chromatic aberration corrected transmission electron microscope‹‹
Dirk Van Dyck University of Antwerp (BELGIUM)
››From Stobbs factor to single particle Cryo-EM‹‹
Thomas Walther
University of Sheffield (UK)
››Measurement of chromatic aberration in  transmission electron microscopes with imaging filters‹‹
Masashi Watanabe Lehigh University (US)
››Toward quantitative analysis of atomic-resolution X-ray maps in an aberration-corrected scanning transmission electron microscope with a large solid-angle detector‹‹

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