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PICO 2013 - Frontiers of Aberration Corrected Electron Microscopy

Second Conference on Frontiers of Aberration Corrected Electron Microscopy in Kasteel Vaalsbroek from 9 to 12 October 2013

PICO 2013, the second Conference on Frontiers of Aberration Corrected Electron Microscopy, took place at Kasteel Vaalsbroek between the 9th and the 12th of October 2013. The meeting was attended by more than 125 delegates including company representatives and a good number of international colleagues. Organisers put together an oral programme of 33 scientific keynote lectures. About the same number of contributions were scheduled for poster presentations.

The event, which was jointly organised by the Ernst Ruska-Centre in Jülich and the Triebenberg Laboratory in Dresden, was supported by the Jülich Research Centre, FEI Company, CEOS GmbH, Gatan GmbH, DENSsolutions, EA Fischione Instruments, Nion Inc, NanoMEGAS and HREM Research Inc.

The scientific programme of PICO 2013 contained an wide range of oral and poster presentations focusing on recent advances in methods and applications for the study of structural and electronic properties of solids by the application of advanced electron microscopy techniques. Topical issues of aberration corrected electron microscopy research were highlighted in keynote presentations given by leading invited experts.

Speakers included Wolfgang Baumeister (Martinsried), Chris Boothroyd (Jülich), Christian Colliex (Paris), Ulrich Dahmen (Berkeley (US)), Rafal Dunin-Borkowski (Jülich), Michael Fiddy (Charlotte), Hamish Fraser (Columbus), Bert Freitag (Eindhoven), Max Haider (Heidelberg), Archie Howie (Cambridge), Martin Hÿtch (Toulouse), Kazuo Ishizuka (Higashimatsuyama), Wolfgang Jäger (Kiel), Chunlin Jia (Jülich), Ute Kaiser (Ulm), Angus Kirkland (Oxford), Ondrej Krivanek (Kirkland), Hannes Lichte (Dresden), Laurie Marks (Evanston), Joachim Mayer (Aachen), Molly McCartney (Tempe), John Rodenburg (Sheffield), Harald Rose (Ulm), Frances Ross (Yorktown Heights), Owen Saxton (Cambridge), Robert Sinclair (Stanford), David Smith (Tempe), John Spence (Tempe), Andreas Thust (Jülich), Knut Urban (Jülich), Dirk Van Dyck (Antwerp), Thomas Walther (Sheffield) and Masashi Watanabe (Lehigh).

One of the highlights of the meeting were two symposia held to honour the scientific careers of David Smith and Owen Saxton who, both, have celebrated their 65th birthdays during the meeting. Superb dinner speeches were given by Archie Howie, John Rodenburg, Robert Sinclair and John Spence. PICO 2013 organisers are grateful to all those who shared their scientific results and contributed to the lively atmosphere of the sessions as well as the social events.

Conference proceedings have been published in as Volume 134 (2013) in a special issue of Ultramicroscopy. The third Conference on Frontiers of Aberration Corrected Electron Microscopy, PICO 2015, is scheduled to take place again in Kasteel Vaalsbroek and will be held from the 19th to the 23rd April 2015.

Further information:

PICO 2013 Conference Pages

PICO 2015 Conference Pages

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