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Microsc Microanal 19 (2013) 310-318

Atomic-scale measurement of structure and chemistry of a single unit cell layer of LaAlO in SrTiO

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Chun-Lin Jia, Juri Barthel, Felix Gunkel, Regina Dittmann, Susanne Hoffmann-Eifert, Lothar Houben, Markus Lentzen, and Andreas Thust

A single layer of LaAlO3 with a nominal thickness of one unit cell, which is sandwiched between a SrTiO3 substrate and a SrTiO3 capping layer, has been quantitatively investigated by high-resolution transmission electron microscopy. By the use of an aberration-corrected electron microscope and by employing sophisticated numerical image simulation procedures, significant progress has been made in two aspects. On the one hand, the structural as well as the chemical features of the interface have been determined simultaneously on an atomic scale from the same specimen area. On the other hand, the evaluation of the structural and chemical data has been carried out in a fully quantitative way on the basis of the absolute image contrast, which has not been achieved so far in materials science investigations using high-resolution electron microscopy.

The present study demonstrates that a fully quantitative interface analysis, which makes positional data available with picometre precision together with the related chemical information, can contribute to a better understanding of the functionality of such interfaces.


Further reading:

Chun-Lin Jia, Juri Barthel, Felix Gunkel, Regina Dittmann, Susanne Hoffmann-Eifert, Lothar Houben, Markus Lentzen, and Andreas Thust: Atomic-scale measurement of structure and chemistry of a single unit cell layer of LaAlO in SrTiO, Microsc Microanal 19 (2013) 310-318.

   
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