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X. Wei, A.K. Tagantsev, A. Kvasov, K. Roleder, C.-L. Jia, N. Setter: Ferroelectric translational antiphase boundaries in nonpolar materials, Nature Communications 5 (2014) 3031.

K. Urban, J. Mayer, J.R. Jinschek, M.J. Neish, R.R. Lugg, L.J. Allen: Achromatic Elemental Mapping Beyond the Nanoscale in the Transmission Electron Microscope. Physical review letters 110 (203) 185507.

J. Barthel und A. Thust: On the optical stability of high-resolution transmission electron microscopes. Ultramicroscopy 134 (2013) 6 - 17 (2013).

C.L. Jia, J. Barthel, F. Gunkel, R. Dittmann, S. Hoffmann-Eifert, L. Houben, M. Lentzen, A. Thust: Atomic-scale measurement of structure and chemistry of a single-unit-cell layer of LaAlO3 embedded in SrTiO3. Microscopy and microanalysis 19 (2013) 310-318.

L. Jin, X. Guo, C.-L. Jia: TEM study of (110)-type 35.26° dislocations specially induced by polishing of SrTiO3 single crystals: Ultramicroscopy 134 (2013)77-85.

A. Alpers, R.J. Gardner, S. König, R.S. Pennington, C.B. Boothroyd, L. Houben, R. Dunin-Borkowski, K. Joost Batenburg: Geometric reconstruction methods for electron tomography. Ultramicroscopy 128 (2013) 42-54.

L. Correlating Electron Tomography and Plasmon Spectroscopy of Single Noble Metal Core-Shell Nanoparticles. Nano letters 12 (2012) 145-150.

M. Direct Imaging of Singel Au Atoms in GaAs Nanowires: Nano letters 12 (2012) 2352-2356.

K. The challenges of graphene, Nature materials 10 (2011) 165-166.

K. Quantitative atom column position analysis at the incommensurate interfaces of a (PbS)(1.14)NbS(2) misfit layered compound with aberration-corrected HRTEM. Ultramicroscopy 111 (2011) 245-250.

C. Direct Observation of Continuous Electric Dipole Rotation in Flux-Closure Domains in Ferroelectric Pb(Zr,Ti)O(3). Science 331 (2011) 1420-1423.

M. Metadislocations in the complex metallic alloys T-Al-Mn-(Pd,Fe). Acta materialia 59 (2011) 4458-4466.

R. Investigating the chemical and morphological evolution of GaAs capped InAs/InP quantum dots emitting atmtting at 1,5 µm using aberration-corrected scanning transmission electron microscopy. Journal of crystal growth 329 (2011) 57-61.

D Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography. Applied physics letters 99 (2011) 261911.

L. A simple algorithm for measuring particle size distributions on an uneven background from TEM images. Ultramicroscopy 111 (2011).

M. Direct measurement of the charge distribution along a biased carbon nanotube bundle using electron holography. Applied physics letters 98 (2011) 243101.

J. Barthel, Th.E. Weirich, G. Cox, H. Hibst, and A. Thust: Structure of Cs0.5[Nb2.5W2.5O14] analysed by focal-series reconstruction and crystallographic image processing. Acta Materialia 58 (2010), 3764-3772.

C.L. Jia, L. Houben, A. Thust, and J. Barthel: On the benefit of the
negative-spherical-aberration imaging technique for quantitative HRTEM. Ultramicroscopy 110 (2010), 500-505.

K.W. Urban: Is science prepared for atomic-resolution electron microscopy?, Nature Materials 8 (2009) 260 – Commentary | Insight

J. Barthel and A. Thust: Quantification of the Information Limit of Transmission Electron Microscopes, Phys. Rev. Lett. 101 (2008) 200801.

K. Urban, L. Houben, C.L. Jia, M. Lentzen, S. Mi, A. Thust, and K. Tillmann: Atomic-Resolution Aberration-Corrected Transmission Electron Microscopy, Advances in Imaging and Electron Physics 153 (2008) 439-480.

K. Urban: Studying Atomic Structures by Aberration-Corrected Transmission Electron Microscopy. Science 321 (2008), 506-510. [pdf-file]

M. Lentzen: Contrast Transfer and Resolution Limits for Sub-Ångström High-Resolution Transmission Electron Microscopys. Microscopy and Microanalysis 14 (2008) 16-28 [pdf-file].

M. Bar-Sadan, L. Houben, S.G. Wolf, A. Enyashin, G. Seifert, R. Tenne, and K. Urban, K.: Toward Atomic-Scale Bright-Field Electron Tomography for the Study of Fullerene-Like Nanostructures, Nano Letters, 8 (2008) 891 - 896.

K. Tillmann, L. Houben, and A. Thust: Atomic-resolution imaging of lattice imperfections in semiconductors by combined aberration-corrected HRTEM and exit-plane wavefunction retrieval. Philosophical Magazine 86 (2006), 4589-4606.

C.L. Jia, L. Houben, and K.Urban: Atom vacancies at a screw dislocation core in SrTiO. Phil. Mag. Lett. 86 (2006) 683

L. Houben: Aberration-corrected HRTEM of defects in strained La2CuO4 thin films grown on SrTiO3. Journal of Materials Science 41 (2006), 4413-4419.

K. Tillmann, L. Houben, A. Thust, and K. Urban: Spherical-abberation correction in tandem with the restoration of the exit plane wavefunction - synergetic tools for the imaging of lattice imperfections in crystalline solids at atomic resolution. Journal of Materials Science 41 (2006), 4420-4433.

N. Hueging, M. Luysberg, H. Trinkaus, K. Tillmann, K. Urban: Quantitative Pressure an Strain Field Analysis of Helium Precipitates in Silicon. J. Mat. Sci. 41, (2006) 4454

M. Lentzen: Progress in aberration-corrected hight-resolution transmission electron microscopy using hardware aberration correction. Microscopy and Microanalysis 12 (2006), 191-205. [pdf-file]

L. Houben, A. Thust, and K. Urban: Atomic-precision determination of the reconstruction of a 90° tilt boundary in YBa2Cu3O7-d by aberration corrected HRTEM. Ultramicroscopy 106 (2006), 200-214.

K. Tillmann, A. Thust, A. Gerber, M.P. Weides and K. Urban: Atomic structure of beta-tantalum nanocrystallites. Microscopy and Microanalysis 11 (2005), 534-544. [pdf-file]

C.L. Jia, A. Thust, K. Urban: Atomic-scale analysis of the oxygen configuration at a SrTiO3 dislocation core, Phys. Rev. Lett. 95 (2005) 225506.

K. Tillmann, A. Thust and K. Urban: Spherical aberration correction in tandem with exit-plan wave function reconstruction: Interlocking tools for the atomic scale imaging of lattice defects in GaAs. Microscopy and Microanalysis 10 (2004), 185-198. [pdf-file]

C.L. Jia, M. Lentzen and K. Urban: High-resolution transmission electron microscopy using negative spherical aberration. Microscopy and Microanalysis 10 (2004), 174-184. [pdf-file]

M. Lentzen: The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imaging. Ultramicroscopy 99 (2004), 211-220.

K. Tillmann, N. Hueging, H. Trinkaus, M. Luysberg and K. Urban: Quantitative transmission electron microscopy analysis of the pressure of helium-filled cracks in implanted silicon. Microscopy and Microanalysis 10 (2004), 199-214.

C.L. Jia, M. Lentzen and K. Urban:Atomic-Resolution Imaging of Oxygen in Perovskite Ceracmics. Science 299 (2003), 870-873.

K. Tillmann, M. Luysberg, P. Specht and E.R. Weber: Impact of beryllium dopants on the stability of LT-grown AlAs/GaAs: Be heterostructures against thermally activated intermixing. Thin Solid Films 737 (2003), 74-82.
 
C.L. Jia, J. Rodriguez Contreras, J. Schubert, M. Lentzen, U. Poppe, H. Kohlsstedt, K. Urban, R. Waser: Introduction and characterization of interfacial defects in SrRuO3/BaTiO3/SrRuO3 multilayer films. Journal Crystal Growth 247 (2002), 381.

K. Tillmann, M. Luysberg, P. Specht and E.R. Weber: Direct compositional analysis of AlGaAs/GaAs heterostructures by the reciprocal space segmentation of high-resolution micrographs. Ultramicroscopy 93 (2002), 123-137.

M. Lentzen, B. Jahnen, C.L. Jia, A. Thust, K. Tillmann and K. Urban:. High-resolution imaging with an aberration-corrected transmission electron microscope. Ultramicroscopy 92 (2002), 233-242.

L. Kirste, Ch. Haug, R. Brenn, K.W. Benz and K. Tillmann: Structural quality and ordering of MBE grown AlGaN-layers. Materials Science and Engineering B82 (2001), 9-11.

 K. Tillmann, H. Trinkaus and W. Jäger: Self-assembled SiGe nanostructures, In "Properties of Silicon Germanium and SiGe:Carbon", EMIS Datareview Series No. 24 (2000), 63-74, edited by E. Kasper and K. Lyutovich, published by the Institution of Electrical Engineers IEE (London). [pdf-file]

M. Lentzen and K. Urban: Reconstruction of the projected crystal potential in transmission electron microscopy by means of a maximum-likelihood refinement algorithm. Acta Cryst. A 56 (2000). 235

A. Thust, M. Lentzen, K. Urban: The Use of Stochastic Algorithms for Phase Retrieval in HRTEM. Scanning Microscopy Supplement 11 (2000), 435-452.

K. Tillmann and A. Förster: Critical dimensions for the formation of interfacial misfit dislocations of InGaAs islands on GaAs(001). Thin Solid Films 368 (2000), 93-104 and Thin Solid Films 379 (2000), 313.

K. Tillmann, M. Lentzen and R. Rosenfeld: Impact of lattice-parameter mismatch induced contrast modifications in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs-heterostructures. Ultramicroscopy 83 (2000), 111-128.

K. Tillmann, W. Jäger, B. Rahmati, H. Trinkaus, R. Loo, L. Vescan and K. Urban: Strain-induced vertical ordering of islands and compositional modifications in LPCVD-grown SiGe/Si-bilayers on Si(001). Phil. Mag. A. 80 (2000), 255-277.

K. Tillmann and W. Jäger: Quantitative HRTEM analysis of Semiconductor Quantum Dots. Journal of Electron Microscopy 49 (2000), 245-257.

D.G. Ebling, L. Kirste, M. Rattunde, J. Portmann, R. Brenn, K.W. Benz and K. Tillmann: Analysis of dislocation densities and nanopipe formation in MBE-grown AlN-layers. Materials Science Forum, Vol. 338-342 (2000), 1549-1552.

C.L. Jia, R. Rosenfeld, A. Thust and K. Urban: Atomic Structure of a  - 3 twin-boundary junction in a BaTiO3 thin film. Phil. Mag. Lett. 79 (1999), 99-106 (1999)

C.L. Jia and A. Thust: Investigation of Atomic Displacements at a Â3 Twin Boundary in BaTiO3 by Means of Phase Retrieval Electron Microscopy. Phys. Rev. Lett. 82 (1999), 5052-5055

M.H.F. Overwijk, A.J. Bleeker, A. Thust: Correction of three-fold astigmatism for ultra-high-resolution TEM. Ultramicroscopy 67 (1997) 163-170.

K. Tillmann, A. Thust, M. Lentzen, P. Swiatek, A. Förster K. Urban and W. Laufs: Determination of segregation, elastic strain and thin-foil relaxation in InGaAs islands by high-resolution transmission electron microscopy. Phil. Mag. Lett. 74 (1996), 309-315.

M. Lentzen and K. Urban: Reconstruction of the projected crystal potential from a periodic high-resolution electron microscopy exit plane wave function. Ultramicroscopy 62 (1996), 89-102.

A. Thust. M.H.F. Overwijk, W.M.J. Coene and M. Lentzen: Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy 64 (1996), 249.





   
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