10th Conference on Frontiers
of Electron Microscopy
in Materials Science

programme @ femms2005::

The programme of femms2005 was primarily composed of invited oral presentations together with contributions from the greater scientific community selected by the organisers. An important venue for sharing of technical information were the poster sessions took place at the second and third nights of the conference.


oral presentations @ femms2005::

Please follow this link to download an a4 size >>> oral programme overview.

Please follow this link to download the complete >>> programme.


monday, 26th september 2005
0845-0855 Welcome to Conference
>>> Knut Urban and >>> Joachim Mayer Ernst Ruska-Centre Jülich
0855-0900
Opening Remarks
>>> Burkhard Jahnen German Research Foundation (DFG)
session (a):: instrumentation
chair:: >>> Harald Rose
0900-0945
Improved resolution by means of novel electron optical devices
>>> Max Haider CEOS GmbH, Heidelberg (Germany)

0945-1030
Ultrafast electron microscopy and diffraction
>>> Wayne King Lawrence Livermore National Laboratory (US)

1030-1100
Coffee Break

1100-1145
Design and performance of the Nion UltraSTEM
>>> Ondrej Krivanek Nion Co., Kirkland (US)

1145-1215
Energy filtering transmission electron microscopy with a corrected 90° omega-filter
>>> Helmut Kohl University of Münster (Germany)

1215-1245
SMART, an aberration-corrected low-voltage electron spectro-microscope for extended surface studies
>>> Eberhard Umbach University of Würzburg (Germany)

1245-1400
Lunch

session (b):: phase contrast
chair:: >>> Dirk van Dyck
1400-1445
Iterative phase retrieval of complex infinite specimen transmission functions from diffraction patterns
>>> John Rodenburg University of Sheffield (UK)

1445-1530
Towards atomic resolution by electron tomography on a discrete grid
>>> Christian Kisielowski Lawrence Livermore National Laboratory (US)

1530-1600
Coffee Break
1600-1630
A review of phase contrast imaging and phase retrieval with electrons
>>> David Paganin CSIRO (Australia)

1630-1715
Aspects of contrast theory for HRTEM at the sub-Ångström frontier
>>> Markus Lentzen Ernst Ruska-Centre Jülich (Germany)

1715-1745
Measuring, correcting and compensating aberrations for HREM
>>> Angus Kirkland University of Oxford (UK)

1745-1815
Electron holography using a Cs-Corrected TEM: Towards the frontiers of atomic characterisation
>>> Michael Lehmann University of Dresden (Germany)

1815-2000
Dinner
2000-2200 Lectures of Representatives of Companies



tuesday, 27th september 2005
session (c):: probes
chair:: >>> Stephen J Pennycook
0830-0915
High Spatial and Energy Resolution EELS
>>> Nigel D Browning Lawrence Berkeley National Laboratory (US)

0915-1000
Complex oxide characterisation in the aberration corrected STEM
>>> Maria Varela Universidad Carlos III de Madrid (Spain)

1000-1045
Aberration corrected STEM imaging; what's new?
>>> Andrew Bleloch Daresbury Laboratory (UK)

1045-1115
Coffee Break
1115-1145
Z-contrast STEM study of amorphous intergranular phases in silicon nitride ceramics
>>> Naoya Shibata University of Tokyo (Japan)

1145-1215
Early results from an aberration corrected JEOL 2200FS at Oak Ridge National Laboratory
>>> Douglas A Blom Oak Ridge National Laboratory (US)

1215-1245
Examiniation of intergranular glassy films by energy-filtered electron diffraction
>>> Christoph T Koch MPI for Metals Research Stuttgart (Germany)

1245-1400
Lunch
session (d):: energy dispersive x-ray analysis
chair:: >>> David B Williams
1400-1445
Electron-excited energy dispersive X-ray spectrometry at high speed and at high resolution: silicon drift detectors and microcalorimeters
>>> Dale Newbury

1445-1530
Automated multivariate statistical analysis of SEM and STEM X-ray spectral images
>>> Paul Kotula Sandia National Laboratory (US)

1530-1600
Coffee Break

1600-1645
Frontiers of X-ray analysis in analytical electron microscopy: Towards atomic-scale resolution and single-atom sensitivity
>>> Masashi Watanabe Lehigh University Bethlehem (US)

1645-1715
Irradiation effects in steels: Quantitative microanalysis of irradiation-induced nanoprecipitates in low alloy steels via FEG-STEM EDS microanalysis and 3D-APFIM
>>> Gracie Burke Bettis Atomic Power Laboratroy (US)

1715-1745
Analytical TEM for 3D reconstructions of nanocomposites
>>> Günther Möbus University of Sheffield (UK)

1745-1815
Conventional and unconventional electron tomography
>>> Paul Midgley University of Cambridge (UK)

1815-2000
Dinner
2000-2200 poster session (pa)



wednesday, 28th september 2005
session (e):: special topics
chair:: >>> Ulrich Dahmen
0830-0915
Fluctuation microscopy: A sensitive probe of medium range order in disordered materials
>>> Mike MJ Treacy Arizona State University (US)

0915-1000
Low Energy Electron Microscopy
>>> Ruud M Tromp IBM T.J. Watson Research Center (US)

1000-1045
New developments in electron nanodiffraction and new applications to materials characterisation
>>> Jian Min Zuo University of Illinois at Urbana-Champaign (US)

1045-1115
Coffee Break

1115-1200
Synchrotron X-ray microscopy as a tool in materials science and nanoscience
>>> J Murray Gibson Argonne National Laboratory (US)

1200-1300
femms 2005 lecture:: Scanning transmission electron microscopy and electron energy loss spectroscopy in materials science
>>> John Silcox Cornell University (US)

1300-1400
Lunch
1400-1815 excursion
1815-2000
Dinner

2000-2200 poster session (pb)




thursday, 29th september 2005
session (f):: electron energy loss spectroscopy
chair:: >>> Ferdinand Hofer
0830-0915
EELS in materials science: Why some interfaces can never be sharp
>>> David Muller Cornell University (US)

0915-1000
Exploring the resolution limits with a monochromated (S)TEM
>>> Werner Grogger University of Graz (Austria)

1000-1045
Probing complex oxides and nanostructured materials using electron energy-loss spectroscopy
>>> David McComb Imperial College London (UK)

1045-1115
Coffee Break

1115-1145
Low-Loss EELS and optical properties: The role of calculations from first principles
>>> Vicky J Keast University of Sydney (Australia)

1145-1215
Principles of energy loss chiral dichroism in the TEM
>>> Peter Schattschneider

1215-1245
ELNES, chemical bonding, and properties of metal/ceramic interfaces
>>> Teruyasu Mizoguchi University of Tokyo (Japan)

1245-1400
Lunch

session (g):: defects
chair:: >>> Ian M Robertson
1400-1445
Characterising small point-defect clusters in the TEM - new approaches to an old problem
>>> Mike Jenkins University of Oxford (UK)

1445-1530
TEM analysis of dislocation properties in metallic alloys
>>> Patrick Veyssiere CRNS Chatillon (France)

1530-1600
Coffee Break

1600-1645
Dislocations and mechanical properties of icosahedral AlPdMn quasicrystals
>>> Daniel Caillard CNRS Toulouse (France)

1645-1715
Position and size controlled fabrication of nm-sized structures with intense focused electron beam
>>> Kazuo Furuya National Instiute for Materials Science Tsukuba (Japan)

1715-1745
Small-scale plasticity of thin films
>>> Gerhard Dehm University of Leoben (Austria)

1745-1815
Quantitative measurement of the composition of embedded Cu-rich precipitates in ferritic steel
>>> John Titchmarsh University of Oxford (UK)

1915-2000
Sherry and Wine Reception

2000
Conference Dinner




friday, 30th september 2005
session (h):: interfaces
chair:: >>> C Barry Carter
0830-0915
Atomic structures, chemistry and properties in ceramic interfaces
>>> Yuichi Ikuhara University of Tokyo (Japan)

0915-1000
Atomistic studies of line defects at grain boundaries
>>> Douglas L Medlin Sandia National Laboratory (US)

1000-1045
Stress fields at boundaries between contacting small particles
>>> Anders Thölen Chalmers University Göteborg (Sweden)

1045-1115
Coffee Break

1115-1200
Aberration-corrected transmission electron microscopy in materials science
>>> Knut Urban Ernst Ruska-Centre Jülich (Germany)

1200-1230
Imaging and irradiation of nanotubes in a field emission TEM: Analysis and manipulation on the sub-nanometre scale
>>> Florian Banhart University of Mainz (Germany)

1230-1300
In-situ imaging and measuring of micromagnetic behaviour
>>> Josef Zweck University of Regensburg (Germany)

1300-1400
Lunch



distinguished lecturer @ femms2005::

At each meeting the international advisory committee of femms names a distinguished lecturer whose work in electron microscopy has had broad impact in the field of materials science.

announcing the femms2005
distinguished lectureship award
to::

Professor John Silcox


John Silcox, David E Burr Professor of Applied and Engineering Physics at Cornell University, is a leader in the area of electron microscopy. The driving theme of his research programme is the exploitation of atomic size electron beam coupled with electron spectroscopy to determine electronic-structural features on an atomic scale. Typical questions addressed in the recent past include the growth of thin-film structures, bonding at interfaces in metals and meta/ceramic hetero-interfaces and the strain and atomic distributions in quantum wells and wires. This provides atomic precision maps of the electron scattering in the sample. Critical to understanding the observations is accurate simulation of the propagation of the electron beam through the thin-film sample is critical to accurate interpretation of the observations and there is an ongoing effort in collaboration with Dr Earl J Kirkland at improving the understanding of electron scattering.

With this approach it has proven possible to separate amorphous sp2 bonded carbon from diamond, silicon carbide from silicon oxide and silicon, all with a 5 Å spatial resolution. This was important in understanding the growth processes. Strains have been measured around quantum wires embedded in GaAs. It proved possible to measure the lattice parameters on about a 20 Å area to +/- 0.005 Å level. This proved valuable in establishing that observed shifts in the photoluminescence were due to strain rather than quantum confinement. Finally, electron energy loss spectra in 3d transition metal systems reflect local changes in the unoccupied d-density-of-states. These in turn can be shown to reflect changes in the bonding at the boundaries and thus, eventually, to give quantitative estimates of increases in the heat of formation at the boundaries. Finally, these estimates are used to provide an electronic structure contribution to the grain boundary energy for use in criteria that determine the transition from inter to trans granular failure. Copper/magnesium oxide interfaces have been studied and GaN/AlGaN interfaces are currently under study. New insights into silicate glass/ metal interfaces have been obtained and extensive studies of radiation damage in silicate glasses reveal the precipitation of tiny metallic spheres that alter the optical properties.

John Silcox received a BSc from Bristol University in 1957 and a PhD from Cambridge University in the field of Physics in 1961. He joined Cornell University in 1961 and has twice served as director of the School of Applied and Engineering Physics, and as director of the Materials Science Center. He is a fellow of the American Physical Society and a member and past president of the Electron Microscopy Society of America, from whom he received the 1996 Distinguished Scientist Award in physical sciences. For 1978 through 1982 he served on the Solid State Sciences Committee of the National Academy of Sciences/National Research Council. In 1988 he was named the David E. Burr Professor of Engineering at Cornell University. John Silcox has been a member and chair of the Materials Research Advisory Committee for the National Science Foundation, and also served on advisory committee to the Arizona State University. He is chair of the Steering Committee for the Electron Microscopy Center at Argonne National Laboratory.  In 1998 he was appointed as the Vice Provost for Research for the Physical Sciences and Engineering.

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