10th Conference on Frontiers
of Electron Microscopy
in Materials Science

about @ femms2005::

The 10th international conference on Frontiers of Electron Microscopy in Materials Science (femms2005) will be held

25th – 30th September 2005

at the

>>> Kasteel Vaalsbroek

located in the Netherlands in-between the mediaeval imperial residence town of Aachen in Germany and the hanseatic city of Maastricht in the Netherlands.

newsletter @ femms2005::

Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons Ernst Ruska-Centrum für Mikroskopie und Spektroskopie mit Elektronen Ernst Ruska-Centre Jülich Ernst Ruska-Centrum Jülich Ernst Ruska Centrum Jülich ER-C Jülich Juelich TEM HRTEM CBED elektronenmikroskopie electron microscopy transmissionselektronenmikroskopie transmission electron microcopy aberration correction ceramics hrtem methods metals nanostructures semiconductors TEM HRTEM
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conference main topic areas @ femms2005::

Electron microscopy experiences the most revolutionary period since its invention, with substantial advances in the performance of sources, imaging lenses and spectrometers all at roughly the same time. Hence, this is also the ideal time for electron microscopists to appraise when, how, and why the appropriate techniques should be used for specific problems in materials science to gain deeper scientific insights.

Developments in instrumental technology and applications in materials science covering the whole range of solid state materials will be described. Work reported at the conference will extend from new fundamental materials observations through to important developments in device processing and instrumental progress.

The meeting will adress a bunch of late-breaking aspects of electron microscopy and spectroscopy techniques in tandem with materials science related applications, e.g.:

  • New instrumentation in TEM and STEM - Prospects of aberration correction and monochromation.

  • Expected new information from advanced instrumentation - Materials science applications highlighting novel hardware and software techniques.

  • Advances in spectroscopy techniques at highest spatial and energy resolution.

  • Progresses in electron holography.

  • Novel applications of electron holography.

  • Nanostructural features of all types of strucural and functional materials for information technology.

  • Microscopic investigations of lattice defects and internal boundaries together with the impurity behaviour in solid state materials.

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