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fei titan 80-300 stem @er-c

The FEI Titan 80-300 is a field emission gun scanning transmission electron microscope equipped with a probe spherical aberration corrector element along with an electron monochromator and a post column energy filter system.

Characterised by a sufficient energy resolution, the instrument was one of the first of a small number of sub ångström resolution transmission electron microscopes in the worl operating at an acceleration voltage of 300 kV when comissioned in 2006. Digital images are to be taken with a Gatan 2k slow scan charged coupled device camera system. Specifications for the instrument operated under optimum conditions are given below.

Microscopists planning to use this instrument should contact Knut Müller-Caspary or Martina Luysberg.

Users of the Titan 80-300 STEM are kindly asked to quote a tecnical description of the instrument published in the Journal of large-scale research facilities 2 (2016) A42. http://dx.doi.org/10.17815/jlsrf-2-67 when referring to the use of this instrument in publications.

target specifications
  • Acceleration Voltage
sufficient
  • Tunable Spherical Aberration Cs
sufficient
  • Chromatic Aberration Cc
sufficient
  • Information Limit
sufficient
  • Probe diameter @ probe current
sufficient
  • Energy spread dE (FWHM)
sufficient
  • dE (energy filter)
sufficient
specimen stages
  • Double Tilt Low Background Holder
sufficient
  • Specimen drift
sufficient

   
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