The FEI Titan 60-300 PICO is a unique fourth generation field emission gun transmission electron microscope equipped with a high-brightness electron gun, a monochromator unit, and a Cs probe corrector. Furthermore, a Cs-Cc achro-aplanat image corrector and a post-column energy filter system are also on hand.

Characterised by a TEM and STEM resolution of about 50 pm at 300 kV, the instrument is one of the few chromatically-corrected high resolution transmission electron microscopes in teh world. Target specifications for the instrument are given below.

Microscopists planning to use this instrument should contact Juri Barthel, Chris Boothroyd or Lothar Houben.

Availability of the microscope: soon

target specifications
Acceleration Voltage		60 kV ... 300 kV
Information Limit (TEM) @ 300 kV		< 0.50 Å
Information Limit (TEM) @ 200 kV		< 0.58 Å
Information Limit (TEM) @ 80 kV		< 0.80 Å
Resolution (STEM) @ 300 kV		< 0.5 Å
Resolution (STEM) @ 200 kV		< 0.8 Å
System Energy Resolution @ 300 kV & 200 pA		< 0.20 eV
System Energy Resolution @ 200 kV & 30 pA		< 0.12 eV
System Energy Resolution @ 80 kV & 40 pA		< 0.10 eV
detectors
Gatan UltraScan 4000 UHS (4k x 4k) charge coupled digital camera.
Gatan Quantum ERS image filter (GIF) with fully 2nd and 3rd order and partially 4th order corrected prisms with a maximum field of view of 17 µm for imaging and 120 mR for diffraction analyses.
specimen stages
Double Tilt Low Background Holder		± 40°
High Field of View Single Tilt Tomography Holder		± 70°
On-axis Rotation Tomography Holder
Total System Drift		< 2 Å/min (rms)